1 results
Depth Profile Chemical State Analysis of Oxide Films on High Temperature Treated Stainless Steel Using EPMA with a Soft X-ray Spectrometer at Variable Accelerating Voltage
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1058-1060
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation